
何婷婷 2015年進入億博檢測技術有限公司,擔任高級銷售顧問。
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地址:深圳市寶安區西鄉街道銀田工業區僑鴻盛文化創意園A棟219-220
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2010年1月22日,南非獨立通信管理局(ICASA)發布了《電子通訊設備技術標準法規》。2013年4月16日,ICASA又發布了有關實施該法規的公告。法規及公告中都規定了技術設備和電子通訊設備的ICASA法規符合性標準清單,這些標準主要涉及設備的電磁兼容(EMC)標準、安全標準和性能標準。其中,EMC標準還包括基礎EMC標準,通用EMC標準和產品/產品族的EMC標準。表1、表2、表3列出了設備進行ICASA認證的基礎EMC標準、通用EMC標準和安全標準。
表1 技術設備和電子通訊設備ICASA認證的基礎EMC標準
設備所述類型
|
適用標準
|
Radio disturbance and immunity apparatus - Measuring apparatus
|
SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
|
Radio disturbance and immunity apparatus - Conducted disturbances
|
SANS 216-1-2(CISPR 16-1-2 ed1.2)
|
Radio disturbance and immunity apparatus - Disturbance power
|
SANS 216-1-3(CISPR 16-1-3 ed2)
|
Radio disturbance and immunity apparatus - Radiated disturbance
|
SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
|
Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
|
SANS 216-1-5(CISPR 16-1-5 ed1)
|
Method of measurement of disturbances and immunity - Conducted disturbance measurements
|
SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
|
Method of measurement of disturbances and immunity - Measurement of disturbance power
|
SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
|
Method of measurement of disturbances and immunity - Radiated disturbance measurements
|
SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
|
Method of measurement of disturbances and immunity - immunity measurements
|
SANS 216-2-4(CISPR 16-2-4 ed1)
|
Limits for harmonic current emissions (equipment input current <= 6A per phase)
|
SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
|
Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
|
SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
|
Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
|
SANS 61000-3-4(IEC 61000-3-4 ed1)
|
Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
|
SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
|
Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
|
SANS 61000-3-11(IEC 61000-3-11 ed1)
|
Electrostatic discharge immunity test
|
SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
|
Radiated, radio-frequency, electromagnetic field immunity test
|
SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
|
Electrical fast transient/burst immunity test
|
SANS 61000-4-4(IEC 61000-4-4 ed2)
|
Surge immunity test
|
SANS 61000-4-5(IEC 61000-4-5 ed2)
|
Immunity to conducted disturbances, induced by radio-frequency fields
|
SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
|
General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
|
SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
|
Power frequency magnetic field immunity test
|
SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
|
Pulse magnetic field immunity test
|
SANS 61000-4-9(IEC 61000-4-9 ed1 1)
|
Damped oscillatory magnetic field immunity test
|
SANS 61000-4-10(IEC 61000-4-10 ed1.1)
|
Voltage dips, short interruptions and voltage variations immunity tests
|
SANS 61000-4-11(IEC 61000-4-11 ed1)
|
Oscillatory waves immunity test
|
SANS 61000-4-12(IEC 61000-4-12 ed2)
|
Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
|
SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
|
Voltage fluctuation immunity test
|
SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
|
Test for disturbances in the frequency range 0 Hz to 150 kHz
|
SANS 61000-4-16(IEC 61000-4-16 ed1.1)
|
Ripple on d.c. input power port immunity test
|
SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
|
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
|
SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
|
Unbalance, immunity test
|
SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
|
Variation of power frequency, immunity test
|
SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
|
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
|
SANS 61000-4-29(IEC 61000-4-29 ed1)
|
Power quality measurement methods
|
SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
|
Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
|
SANS 300132-1(ETS300132-1 V1)
|
Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
|
SANS 300132-2(ETS300132-2 V2.1.2)
|
Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
|
SANS 300132-3(ETS300132-3 V1.2.1)
|
表2技術設備和電子通訊設備ICASA認證的通用EMC標準
設備所述類型
|
適用標準
|
Radio disturbance and immunity apparatus - Measuring apparatus
|
SANS 216-1-1[CISPR 16-1-1 ed2.1](CISPR 16 -1 -1 ed3)
|
Radio disturbance and immunity apparatus - Conducted disturbances
|
SANS 216-1-2(CISPR 16-1-2 ed1.2)
|
Radio disturbance and immunity apparatus - Disturbance power
|
SANS 216-1-3(CISPR 16-1-3 ed2)
|
Radio disturbance and immunity apparatus - Radiated disturbance
|
SANS 216-1-4[CISPR 16-1-4 ed2](CISPR 16-1-4 ed3)
|
Radio disturbance and immunity apparatus - Antenna calibration test sites for 30 MHz to 1000MHz
|
SANS 216-1-5(CISPR 16-1-5 ed1)
|
Method of measurement of disturbances and immunity - Conducted disturbance measurements
|
SANS 216-2-1[CISPR 16-2-1 ed1.1](CISPR 16-2-1 ed2)
|
Method of measurement of disturbances and immunity - Measurement of disturbance power
|
SANS 216-2-2[CISPR 16-2-2 ed1.2](CISPR 16-2-2 ed2)
|
Method of measurement of disturbances and immunity - Radiated disturbance measurements
|
SANS 216-2-3[CISPR 16-2-3 ed2](CISPR 16-2-3 ed3)
|
Method of measurement of disturbances and immunity - immunity measurements
|
SANS 216-2-4(CISPR 16-2-4 ed1)
|
Limits for harmonic current emissions (equipment input current <= 6A per phase)
|
SANS 61000-3-2[IEC 61000-16-3-2 ed3](IEC 61000-3-2 ed3.2)
|
Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connection
|
SANS 61000-3-3(IEC 61000-3-3 ed1.2)&SANS 61000-3-3(IEC 61000-3-3 Ed2)
|
Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A
|
SANS 61000-3-4(IEC 61000-3-4 ed1)
|
Limits Limitations and flicker in low-voltage power supply systems for equipment with rated current greater than 16A
|
SANS 61000-3-5[IEC 61000-3-5 ed1](IEC 61000-3-5 ed2)
|
Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - equipment with rated current <= 75A and subject to conditional connection
|
SANS 61000-3-11(IEC 61000-3-11 ed1)
|
Electrostatic discharge immunity test
|
SANS 61000-4-2[IEC 61000-4-2 ed1.2](IEC 61000-4-2 ed2)
|
Radiated, radio-frequency, electromagnetic field immunity test
|
SANS 61000-4-3[IEC 61000-4-3 ed3](IEC 61000-4-3 ed3. 1)
|
Electrical fast transient/burst immunity test
|
SANS 61000-4-4(IEC 61000-4-4 ed2)
|
Surge immunity test
|
SANS 61000-4-5(IEC 61000-4-5 ed2)
|
Immunity to conducted disturbances, induced by radio-frequency fields
|
SANS 61000-4-6[IEC 61000-4-6 ed2.2](IEC 61000-4-6 ed3)
|
General guide on harmonics and interharmonics measurements and instrumentation, forpower supply systems and equipment connected
|
SANS 61000-4-7[IEC 61000-4-7 ed2](IEC 61000-4-7 ed2.1)
|
Power frequency magnetic field immunity test
|
SANS 61000-4-8[IEC 61000-4-8 ed1.1](IEC 61000-4-8 ed2)
|
Pulse magnetic field immunity test
|
SANS 61000-4-9(IEC 61000-4-9 ed1 1)
|
Damped oscillatory magnetic field immunity test
|
SANS 61000-4-10(IEC 61000-4-10 ed1.1)
|
Voltage dips, short interruptions and voltage variations immunity tests
|
SANS 61000-4-11(IEC 61000-4-11 ed1)
|
Oscillatory waves immunity test
|
SANS 61000-4-12(IEC 61000-4-12 ed2)
|
Harmonics and interharmonics including mains signalling at a.c. power port, low frequencyimmunity tests
|
SANS 61000-4-13[IEC 61000-16-4-13 ed1](IEC 61000-4-13 ed1.1)
|
Voltage fluctuation immunity test
|
SANS 61000-4-14[IEC 61000-16-4-14 ed1.1](IEC 61000-4-14 ed1.2)
|
Test for disturbances in the frequency range 0 Hz to 150 kHz
|
SANS 61000-4-16(IEC 61000-4-16 ed1.1)
|
Ripple on d.c. input power port immunity test
|
SANS 61000-4-17[IEC 61000-4-17 ed1.1](IEC 61000-4-17 ed1.2)
|
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
|
SANS 61000-4-20[IEC 61000-4-20 ed1.1](IEC 61000-4-20 ed2)
|
Unbalance, immunity test
|
SANS 61000-4-27[IEC 61000-4-17 edl](IEC 61000-4-27 ed1.1)
|
Variation of power frequency, immunity test
|
SANS 61000-4-28[IEC 61000-4-28 ed1.1](IEC 61000-4-28 ed1.2)
|
Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
|
SANS 61000-4-29(IEC 61000-4-29 ed1)
|
Power quality measurement methods
|
SANS 61000-4-30[IEC 61000-4-30 ed1](IEC 61000-4-30 ed2)
|
Power supply interface at the input to telecommunication equipment Part 1: Operated byalternating (ac) derived from direct current (dc) sources
|
SANS 300132-1(ETS300132-1 V1)
|
Power supply interface at the input to telecommunication equipment Part 2: Operated by directcurrent (dc)
|
SANS 300132-2(ETS300132-2 V2.1.2)
|
Power supply interface at the input to telecommunication equipment Part 3: Operated byrectified current source, alternating current source or direct current source up to 400 V
|
SANS 300132-3(ETS300132-3 V1.2.1)
|
表3 技術設備和電子通訊設備ICASA認證的安全標準
設備類別
|
適用標準
|
被替代的標準
|
信息技術設備的安全
|
SANS 60950(IEC60950 ed2)
|
SANS 60950(IEC60950 ed1)
|
音頻、視頻及類似電子設備
|
SANS 60065(IEC 60065)
|
無
|
測試、測量、控制及實驗室用的電子設備
|
SANS 61010-1(IEC 61010-1)
|
無
|
何婷婷 2015年進入億博檢測技術有限公司,擔任高級銷售顧問。
精通各類檢測認證標準,服務過上千家企業。 聯系方式:13570847473(微信同號) 座機:0755-33126673 傳真:0755-22639141
郵箱:kefu@ebotek.cn
地址:深圳市寶安區西鄉街道銀田工業區僑鴻盛文化創意園A棟219-220
掃一掃加顧問微信